These pages provide an overview of the semiconductor device research and teaching nanofabrication facilities
'Alloying Contacts to Semiconductor Samples under Controlled Conditions
In assessing the quality of semiconductor materials and devices,
measurements such as Resistivity, Hall mobility and DLTS are commonly used.
These types of measurement require a reliable ohmic electrical contact to be made to the sample.

The Equipment
The alloy furnace comprises three parts, the reaction chamber, the optical observation system and the gas flow control unit which also houses the
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These pages are written & maintained by Adrian Boland-Thoms
